IEEE - Institute of Electrical and Electronics Engineers, Inc. - Advanced automatic test pattern generation and redundancy identification techniques

Author(s): Schulz, M.H. ; Auth, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1988
Conference Location: Tokyo, Japan
Conference Date: 27 June 1988
Page(s): 30 - 35
ISBN (Paper): 0-8186-0867-6
DOI: 10.1109/FTCS.1988.5293
Regular:

Based on the sophisticated strategies used in the automatic test pattern generation system SOCRATES, the authors present several concepts aiming at a further improvement and acceleration of the... View More

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