IEEE - Institute of Electrical and Electronics Engineers, Inc. - Some new algorithms for ESM data processing

Author(s): Chandra, V. ; Jyotishi, B.K. ; Bajpai, R.C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1988
Conference Location: Charlotte, NC, USA
Conference Date: 1 January 1988
Page(s): 108 - 112
ISBN (Paper): 0-8186-0847-1
ISSN (Paper): 0094-2898
DOI: 10.1109/SSST.1988.17025
Regular:

The identification of emitters by an ESM (electronic support measure) system is becoming increasingly difficult due to the presence of emitters exercising complex parameter modulations such as... View More

Advertisement