IEEE - Institute of Electrical and Electronics Engineers, Inc. - CMOS SRAM alpha particle modelling and experimental results

Author(s): Voldman, S. ; Corson, P. ; Patrick, L. ; Nguyen, K. ; Gilbert, L. ; Goodwin, R. ; Maffit, T. ; Murphy, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1987
Conference Location: Washington, DC, USA, USA
Conference Date: 6 December 1987
Page(s): 518 - 521
DOI: 10.1109/IEDM.1987.191474
Regular:

Through the use of device simulation, circuit analysis and experimentation, the alpha particle sensitivities of state-of-the-art CMOS SRAMs have been quantified. Alpha particle immunity exists in... View More

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