IEEE - Institute of Electrical and Electronics Engineers, Inc. - Trends in Design for Testability

Twelfth European Solid-State Circuits Conference

Author(s): Williams, T. W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1986
Conference Location: Delft, The Netherlands, Netherlands
Conference Date: 16 September 1986
Page(s): 146 - 148
Regular:

This paper will present the currently used techniques in the area of Design for Testability. It will begin with the Ad Hoc approaches of In-Circuit techniques, Functional Testing and Signature... View More

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