IEEE - Institute of Electrical and Electronics Engineers, Inc. - Diagnosis of Large Combinational Networks

Author(s): V. Amar ; N. Condulmari
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 1967
Volume: EC-16
Page(s): 675 - 680
ISSN (Paper): 0367-7508
DOI: 10.1109/PGEC.1967.264779
Regular:

A method is described for constructing a set of input patterns able to detect every given failure of a combinational network. The result may not be a minimal set of tests, but it is surely a... View More

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