IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Scanning Method for Drawing Root Loci for Sample-Data Feedback Systems

1985 American Control Conference

Author(s): C.F. Chen ; M.M. Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 1985
Conference Location: Boston, MA, USA, USA
Conference Date: 19 June 1985
Page(s): 1,020 - 1,025
DOI: 10.23919/ACC.1985.4788772
Regular:

Procedures that are efficient in classical manual computing techniques are frequently inefficient for use on digital computers; for example, as pointed out by Polak, the Nyquist criterion we have... View More

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