IEEE - Institute of Electrical and Electronics Engineers, Inc. - Hot carriers in small geometry CMOS

Author(s): Akers, L.A. ; Holly, M.A. ; Lund, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1984
Conference Location: San Francisco, CA, USA, USA
Conference Date: 9 December 1984
Page(s): 80 - 83
DOI: 10.1109/IEDM.1984.190647
Regular:

The effects of hot carriers on the electrical behavior of small geometry NMOS and PMOS devices are reported. Significant changes in device characteristics are shown to occur even at drain voltages... View More

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