IEEE - Institute of Electrical and Electronics Engineers, Inc. - Use of Ambiguity Functions in EMC Analysis

1984 National Symposium on Electromagnetic Compatibility

Author(s): David W. Eppink ; Marvin D. Aasen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 1984
Conference Location: San Antonio, Texas, USA, USA
Conference Date: 24 April 1984
Page(s): 1 - 5
ISBN (Paper): 978-1-5090-3170-2
DOI: 10.1109/ISEMC.1984.7571029
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