IEEE - Institute of Electrical and Electronics Engineers, Inc. - Rigorous Modelling of Single and Coupled Rectangular Dielectric, Waveguide by Transverse Resonance Diffraction

Author(s): Kot, J. ; Rozzi, T. E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1984
Conference Location: Liege, Belgium, Belgium
Conference Date: 10 September 1984
Page(s): 424 - 429
DOI: 10.1109/EUMA.1984.333340
Regular:

Classical transverse resonance is not applicable to non-separable geometries with open boundaries. Discretising by enclosure within ideal metallic walls alters essentially the boundary conditions... View More

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