IEEE - Institute of Electrical and Electronics Engineers, Inc. - Operation of Bulk CMOS Devices at Very Low Temperatures

Author(s): Hanamura, S. ; Aoki, M. ; Masuhara, T. ; Minato, O. ; Sakai, Y. ; Hayashida, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1983
Conference Location: Maui, HI, USA, USA
Conference Date: 13 September 1983
Page(s): 46 - 47
ISBN (Paper): 4-930813-05-0
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