IEEE - Institute of Electrical and Electronics Engineers, Inc. - Memory Effect in Piezoelectric AlN Gates

Author(s): Fathimulla, A. ; Lakhani, A.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1983
Conference Location: Atlanta, GA, USA, USA
Conference Date: 31 October 1983
Page(s): 1,116 - 1,119
DOI: 10.1109/ULTSYM.1983.198237
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