301-1988 IEEE Standard Test Procedures for Amplifiers and Preamplifiers Used With Detectors of Ionizing Radiation

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1989
Status: active
Page Count: 51
ICS Code (Radiation measurements): 17.240
ISBN (Online): 0-7381-0675-5
DOI: 10.1109/IEEESTD.1989.101065

Abstracts

Standard

This standard describes test procedures for amplifiers and preamplifiers that are used with semiconductor, scintillation, and proportional detectors in the spectrometry of ionizing radiation. It supersedes ANSI/IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation detectors for Ionizing Radiation. The title was changed because the same amplifiers used for semiconductor detectors are applicable to other types. In this standard, measuring procedures are given in greater detail because with modern amplifiers, perceived performance often depends on the details of measurement. Tests that are specific to amplifiers with time-variant pulse-shaping filters are not included, nor are tests for pile-up rejectors. Time-variant filters allow shorter pulse-shaping times than linear filters for the same signal-to-noise ratio, and pile-up rejectors block pulses that overlap earlier ones, allowing higher count rates for a given spectral-line resolution. Both techniques have the greatest application at very low energies because wide pulses must be used to optimize the SNR, and at high energies where detector artifacts cause low-side tailing of spectrum lines. The pulse width at 50% of peak amplitude is the main amplifier indicator of shaping time because this parameter best allows a performance comparison among different amplifiers. Compared with other parameters, this one is the easiest to measure accurately with an oscilloscope and pulse generator.<>

Document History

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This standard specifies the make-up or assembly of leaders and cue marks for 70-, 35-, and 16-mm motionpicture release prints for use in motion-picture theaters and screening rooms.

301-1988 - IEEE Standard Test Procedures for Amplifiers and Preamplifiers Used With Detectors of Ionizing Radiation
January 1, 1989 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

This standard describes test procedures for amplifiers and preamplifiers that are used with semiconductor, scintillation, and proportional detectors in the spectrometry of ionizing radiation. It supersedes ANSI/IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Sem...

301-1976 - IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semi- Conductor Radiation Detectors for Ionizing Radiation
January 30, 1976 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

This standard provides standard test procedures for amplifiers and preamplifiers for semiconductordetectors for ionizing radiation. It supersedes the previous edition, IEEE Std 301-1969(ANSI N42.2-1969). The standard has been modified and refined based on the experience gained inusing the earlier ed...

301-1969 - IEEE Test Procedures for Amplifiers and Preamplifiers for SemiConductor Radiation Detectors (For Ionizing Radiation)
February 11, 1969 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Semiconductor radiation detectors have come into widespread use in recent years for detection of ionizing radiation. Both silicon and germanium detectors have been developed with silicon finding its principal application in the detection and analysis of heavy charged particles. Germanium detectors w...

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