101-1987 IEEE Guide for the Statistical Analysis of Thermal Life Test Data

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 31 December 1988
Status: active
Page(s): 1 - 34
ISBN (Electronic): 978-0-7381-0826-1
DOI: 10.1109/IEEESTD.1988.7473795

Abstracts

Standard

Statistical analyses of data from thermally accelerated aging tests are described. The basis and use of statistical calculations are explained. Data analysis, estimation of the relationship between life and temperature, and the comparison between two sets of data are covered.

Document History

101-1987 - IEEE Guide for the Statistical Analysis of Thermal Life Test Data
July 29, 2011 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Statistical analyses of data from thermally accelerated aging tests are described. The basis and use of statistical calculations are explained. Data analysis, estimation of the relationship between life and temperature, and the comparison between two sets of data are covered.

ST 101:2003 - For Motion-Picture Film (16-mm) — Perforated 2R-3000 — Magnetic Striping
December 14, 2003 - Society of Motion Picture and Television Engineers

This standard specifies the location and dimensions of the magnetic striping material applied to 16-mm motion-picture film with perforations along both edges to be used for both picture and audio.

101-1987 - IEEE Guide for the Statistical Analysis of Thermal Life Test Data
December 31, 1988 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Statistical analyses of data from thermally accelerated aging tests are described. The basis and use of statistical calculations are explained. Data analysis, estimation of the relationship between life and temperature, and the comparison between two sets of data are covered.

101-1987 - IEEE Guide for the Statistical Analysis of Thermal Life Test Data
December 31, 1988 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Statistical analyses of data from thermally accelerated aging tests are described. The basis and use of statistical calculations are explained. Data analysis, estimation of the relationship between life and temperature, and the comparison between two sets of data are covered.

101-1987 - IEEE Guide for the Statistical Analysis of Thermal Life Test Data
January 1, 1988 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Accelerated insulation test procedures usually call for a number of specimens to be aged at each of several temperatures appreciably above normal operating temperatures. High temperatures are chosen to produce specimen failures (according to specified failure criteria) in typically one week to one y...

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