660-1986 IEEE Standard for Semiconductor Memory Test Pattern Language

inactive - Inactive: Withdrawn
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 18 February 1986
Status: inactive
Page(s): 1 - 14
ISBN (Online): 978-1-5044-0412-9
DOI: 10.1109/IEEESTD.1986.7434526

Abstracts

Regular

The purpose of this standard is to establish a common language for describing functional tests of memory devices. That language definition includes the vocabulary and grammar necessary to specify the functional testing of memory devices. The language is intended to be used as a general descriptive language rather than one for programming a tester. As a result, the grammar and syntax are defined in a looser and more general way than would be required for a programming language.

Document History

660-1986 - IEEE Standard for Semiconductor Memory Test Pattern Language
February 18, 1986 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

The purpose of this standard is to establish a common language for describing functional tests of memory devices. That language definition includes the vocabulary and grammar necessary to specify the functional testing of memory devices. The language is intended to be used as a general descriptive l...

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