425-1957 AIEE Test Code for Transistors - Semiconductor Definitions and Letter Symbols

inactive - Inactive: Withdrawn
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 23 August 1957
Status: inactive
Page(s): 1 - 40
ISBN (Online): 978-1-5044-0341-2
DOI: 10.1109/IEEESTD.1957.7419169

Abstracts

Regular

The paper discussed the test code for transistors, its semiconductor definitions and letter symbols.

Standard

Test code for Transistors - semiconductor definitions and letter symbols.

Document History

ST 425-1:2011 - Source Image Format and Ancillary Data Mapping for the 3 Gb/s Serial Interface
March 30, 2011 - Society of Motion Picture and Television Engineers

This standard defines three mapping formats: Level A, Level B Dual-Link mapping and Level B Dual-Stream mapping as described below; - Level A specifies: - The direct mapping of various uncompressed video image formats as defined in Table 1; - The direct mapping of packetized dat...

425-1957 - AIEE Test Code for Transistors - Semiconductor Definitions and Letter Symbols
August 23, 1957 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

The paper discussed the test code for transistors, its semiconductor definitions and letter symbols.

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