62860-2013 IEC/IEEE Test methods for the characterization of organic transistors and materials

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 30 July 2013
Status: active
Page(s): 1 - 28
ICS Code (Physics. Chemistry): 07.030
ICS Code (Transistors): 31.080.30
ISBN (Online): 978-0-7381-8685-6
DOI: 10.1109/IEEESTD.2013.6617657

Abstracts

Standard

Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.

Document History

62860-2013 - IEC/IEEE Test methods for the characterization of organic transistors and materials
July 30, 2013 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is n...

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