1450.6-2005 IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 24 February 2012
Status: active
Page(s): 1 - 120
ISBN (Online): 978-0-7381-4805-2
DOI: 10.1109/IEEESTD.2012.6157581

Abstracts

Standard

The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group. In an SoC flow, the smaller design embedded in the larger design is commonly called a core and the larger design is commonly called the SoC. The core is a design provided by a core provider, and the task of incorporating the sub-design into the SoC is called Core System Integration.

Document History

1450.6-2005 - IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
February 24, 2012 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group. In an SoC flow, the smaller design embedded in the larger design is commonly called a core and the larger de...

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