1581-2011 IEEE Standard for Static Component Interconnection Test Protocol and Architecture

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 20 June 2011
Status: active
Page(s): 1 - 61
ICS Code (Integrated circuits. Microelectronics): 31.200
ISBN (Online): 978-0-7381-6613-1
DOI: 10.1109/IEEESTD.2011.5930310

Abstracts

Regular

IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE Std 1149.1™) is not feasible. This standard describes the implementation rules for the test logic and test mode access/exit methods in compliant ICs. The standard is limited to the behavioral description of the implementation and will not include the technical design for the test logic or test mode control circuitry.

Standard

IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE Std 1149.1(TM)) is not feasible. This standard describes the implementation rules for the test logic and test mode access/exit methods in compliant ICs. The standard is limited to the behavioral description of the implementation and will not include the technical design for the test logic or test mode control circuitry.

Document History

1581-2011 - IEEE Standard for Static Component Interconnection Test Protocol and Architecture
June 20, 2011 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE Std 1149.1™) is not feasible. This standard describes the implementation rules...

P1581/D1.37, Jan 2011 - IEEE Draft Standard for Static Component Interconnection Test Protocol and Architecture
February 21, 2011 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory Integrated Circuits (ICs) where additional pins for testing are not available and implementing Boundary-Scan (IEEE 1149.1) is not feasible. This standard describes the implementation rules for the tes...

P1581 - IEEE Draft Standard for Static Component Interconnection Test Protocol and Architecture
October 8, 2010 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory Integrated Circuits (ICs) where additional pins for testing are not available and implementing Boundary-Scan (IEEE 1149.1) is not feasible. This standard describes the implementation rules for the tes...

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