1149.4-2010 IEEE Standard for a Mixed-Signal Test Bus

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 18 March 2011
Status: active
Page(s): 1 - 116
ICS Code (Printed circuits and boards): 31.180
ISBN (Online): 978-0-7381-6523-3
DOI: 10.1109/IEEESTD.2011.5738198

Abstracts

Regular

The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.

Standard

The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.

Document History

1149.4-2010 - IEEE Standard for a Mixed-Signal Test Bus
March 18, 2011 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and...

P1149.4 - IEEE Draft Standard for a Mixed-Signal Test Bus
October 7, 2010 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

The testability structure for digital circuits described in IEEE Std 1149.1 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and appli...

P1149.4/D14, Apr 2009 - Standard for a Mixed-Signal Test Bus
January 1, 2009 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and ...

1149.4-1999 - IEEE Standard for a Mixed-Signal Test Bus
January 1, 2000 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

The testability structure for digital circuits described in IEEE Std 1149.1-1990 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and ...

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