1450.6.1-2009 IEEE Standard for Describing On-Chip Scan Compression

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 13 July 2009
Status: active
ICS Code (Languages used in information technology): 35.060
ISBN (Electronic): 978-0-7381-5962-1
ISBN (Paper): 978-0-7381-5963-8
DOI: 10.1109/IEEESTD.2009.5165453

Abstracts

Standard

This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for each step independent of on-chip scan compression logic used.

Document History

1450.6-2005 - IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
September 10, 2013 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group. In an SoC flow, the smaller design embedded in the larger design is commonly called a core and the larger de...

1450.6.1-2009 - IEEE Standard for Describing On-Chip Scan Compression
July 13, 2009 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for each step independent of on-chip scan compression logic used.

1450.6-2005 - IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
January 1, 2006 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group. In an SoC flow, the smaller design embedded in the larger design is commonly called a core and the larger de...

P1450.6/D1.6, Jun 2005 - Unapproved IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL) (Replaced by Approved IEEE Draft)
January 1, 2005 - IEEE - Institute of Electrical and Electronics Engineers, Inc.
A description is not available for this item.
P1450.6/D1.6, Jun 2005 - IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL)
January 1, 2005 - IEEE - Institute of Electrical and Electronics Engineers, Inc.
A description is not available for this item.
P1450.6/D1.5 - Upproved IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL) (Superseded by P1450.6/D1.6)
January 1, 2004 - IEEE - Institute of Electrical and Electronics Engineers, Inc.
A description is not available for this item.
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