592-2007 IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors - Redline

active - Revision of 592-1990
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 8 May 2008
Status: active
Page(s): 1 - 18
ICS Code (Connecting devices): 29.120.20
ISBN (Online): 978-0-7381-6974-3
DOI: 10.1109/IEEESTD.2008.5961574

Abstracts

Standard

Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.

Document History

592-2007 - IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors
May 8, 2008 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.

592-2007 - IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors - Redline
May 8, 2008 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.

P592/D3, Oct 2007 - IEEE Draft Standard for Exposed Semiconducting Shields on High Voltage Cable Joints and Separable Connectors
January 1, 2007 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

IEEE Standard 592-1990, IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically jo...

P592/D3, Oct 2007 - IEEE Draft Standard for Exposed Semiconducting Shields on High Voltage Cable Joints and Separable Connectors
January 1, 2007 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

IEEE Standard 592-1990, IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically jo...

592-1990 - IEEE Standard for Exposed Semi-conducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors
January 1, 1991 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<>

592-1977 - IEEE Standard for Exposed Semiconducting Shields on Premolded High Voltage Cable Joints and Separable Insulated Connectors
January 1, 1977 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Cable accessories, specifically separable insulated connectors and cable joints, used with extruded dielectric cable rated above 5 kV, are required to have an outer semiconducting shield covering their insulation surfaces. The shield is intended to protect the insulation, to provide voltage stress r...

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