1139-2008 IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology---Random Instabilities

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 27 February 2009
Status: active
ICS Code (Measurement of time, velocity, acceleration, angular velocity): 17.080
ISBN (Electronic): 978-0-7381-6855-5
ISBN (Paper): 978-0-7381-6856-2
DOI: 10.1109/IEEESTD.2008.4797525

Abstracts

Standard

Methods of describing random instabilities of importance to frequency and time metrology are covered. Quantities covered include frequency, amplitude, and phase instabilities; spectral densities of frequency, amplitude, and phase fluctuations; and time-domain deviations of frequency fluctuations. In addition, recommendations are made for the reporting of measurements of frequency, amplitude, and phase instabilities, especially in regard to the recording of experimental parameters, experimental conditions, and calculation techniques.

Document History

1139-2008 - IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random Instabilities
February 27, 2009 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Methods of describing random instabilities of importance to frequency and time metrology are covered in this standard. Quantities covered include frequency, amplitude, and phase instabilities; spectral densities of frequency, amplitude, and phase fluctuations; and time-domain deviations of frequency...

1139-2008 - IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology---Random Instabilities
February 27, 2009 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Methods of describing random instabilities of importance to frequency and time metrology are covered. Quantities covered include frequency, amplitude, and phase instabilities; spectral densities of frequency, amplitude, and phase fluctuations; and time-domain deviations of frequency fluctuations. In...

1139-2008 - IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random Instabilities - Redline
February 27, 2009 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Methods of describing random instabilities of importance to frequency and time metrology are covered in this standard. Quantities covered include frequency, amplitude, and phase instabilities; spectral densities of frequency, amplitude, and phase fluctuations; and time-domain deviations of frequency...

P1139/D2, May 2008 - IEEE Draft Standard for Definitions of Physical Quantities for Fundamental Frequency and Time Metrology - Random Instabilities
January 1, 2008 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Methods of describing random instabilities of importance to frequency and time metrology are covered in this standard. Quantities covered include frequency, amplitude, and phase instabilities; spectral densities of frequency, amplitude, and phase fluctuations; and time domain deviations of frequency...

1139-1999 - IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology - Random Instabilities
January 1, 1999 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Methods of describing random instabilities of importance to frequency and time metrology is covered in this standard. Quantities covered include frequency, amplitude, and phase instabilities; spectral densities of frequency, amplitude, and phase fluctuations; and time-domain variances of frequency f...

1139-1988 - IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology
January 1, 1989 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

This standard covers the fundamental metrology for describing physical quantities of importance to frequency and time metrology. Quantities covered are frequency instability, phase instability, spectral densities, time instability variances, time prediction, and confidence limits when estimating the...

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