592-2007 IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors

active - Revision of 592-1990
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 8 May 2008
Status: active
Page(s): 1 - 10
ICS Code (Connecting devices): 29.120.20
ISBN (Online): 978-0-7381-5348-3
DOI: 10.1109/IEEESTD.2007.4512343

Abstracts

Regular

Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV are provided in this standard.

Standard

Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.

Document History

592-2007 - IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors
May 8, 2008 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.

592-2007 - IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors - Redline
May 8, 2008 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.

P592/D3, Oct 2007 - IEEE Draft Standard for Exposed Semiconducting Shields on High Voltage Cable Joints and Separable Connectors
January 1, 2007 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

IEEE Standard 592-1990, IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically jo...

P592/D3, Oct 2007 - IEEE Draft Standard for Exposed Semiconducting Shields on High Voltage Cable Joints and Separable Connectors
January 1, 2007 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

IEEE Standard 592-1990, IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically jo...

592-1990 - IEEE Standard for Exposed Semi-conducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors
January 1, 1991 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<>

592-1977 - IEEE Standard for Exposed Semiconducting Shields on Premolded High Voltage Cable Joints and Separable Insulated Connectors
January 1, 1977 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Cable accessories, specifically separable insulated connectors and cable joints, used with extruded dielectric cable rated above 5 kV, are required to have an outer semiconducting shield covering their insulation surfaces. The shield is intended to protect the insulation, to provide voltage stress r...

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