1620-2004 IEEE Standard Test Methods for the Characterization of Organic Transistors and Materials

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2004
Status: inactive
Page Count: 20
ICS Code (Transistors): 31.080.30
ISBN (Paper): 0-7381-3993-9
ISBN (Online): 0-7381-3993-9
DOI: 10.1109/IEEESTD.2004.94492

Abstracts

Standard

Recommended methods and standardized reporting practices for electrical characterization of organic transistors are covered. Due to the nature of organic transistors, significant measurement errors can be introduced if not properly addressed. This standard describes the most common sources of measurement error, and gives recommended practices in order to minimize and/or characterize the effect of each.

Document History

1620-2008 - IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials - Redline
December 5, 2008 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.

1620-2008 - IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
December 5, 2008 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is n...

P1620/D8 Apr 2008 - IEEE Draft Standard for Test Methods for the Characterization of Organic Transistors and Materials
January 1, 2008 - IEEE - Institute of Electrical and Electronics Engineers, Inc.
A description is not available for this item.
P1620/D7, Oct 2007 - IEEE Draft Standard for Test Methods for the Characterization of Organic Transistors and Materials
January 1, 2007 - IEEE - Institute of Electrical and Electronics Engineers, Inc.
A description is not available for this item.
1620-2004 - IEEE Standard Test Methods for the Characterization of Organic Transistors and Materials
January 1, 2004 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Recommended methods and standardized reporting practices for electrical characterization of organic transistors are covered. Due to the nature of organic transistors, significant measurement errors can be introduced if not properly addressed. This standard describes the most common sources of measur...

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