300-1982 IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 10 November 1992
Status: inactive
Page(s): 1 - 30
ISBN (Online): 978-1-5044-0276-7
DOI: 10.1109/IEEESTD.1992.7405228

Abstracts

Standard

The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in wide-spread use for the detection and high resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.

Document History

ST 300:2002 - For Motion-Picture Color Print Film (35-mm) — Manufacturer-Printed Latent Image Identification Information
November 12, 2002 - Society of Motion Picture and Television Engineers

This standard specifies the position, dimensions, content, and exposure of human-readable, latent image information applied onto 35-mm color print film. This information is normally exposed onto the film at the time of manufacture. - This standard also specifies spectral densities and a film ...

300-1982 - IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
November 10, 1992 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in wide-spread use for the detection and high resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements...

300-1988 - IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
January 1, 1988 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. The object of thi...

300-1969 - USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)
February 11, 1969 - IEEE - Institute of Electrical and Electronics Engineers, Inc.

Semiconductor radiation detectors have come into widespread use in recent years for detection and high-resolution spectroscopy of ionizing radiation. Both silicon and germanium detectors have been developed, with silicon finding its principal application in the detection and analysis of heavy charge...

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