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From the Editor-in-Chief
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Guest Editor's Introduction Design Automation
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The VLSI Design Automation Assistant: An IBM System/370 Design
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1984 IEEE International Conference on Computer-Aided Design
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Fast Pass-Transistor Simulation for Custom MOS Circuits
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ACM IEEE 21st Design Automation Conference
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Design for Testability and Self-Testing Approaches for Bit-Serial signal Processors
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IEEE Design&Test of Computers
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Characterization and Testing of Physical Failures in MOS Logic Circuits
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Design for Testability for Complete Test Coverage
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IEEE Design & Test of Computers
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IEEE Design & Test of Computers
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An Integrated Design Automation System for VLSI Circuits
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An Automatic Test-Generation System for Large Digital Circuits
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Our Logic Simulator Will Help You Make It through the next Revolution
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Finally, a Logic Simulator That Keeps up with the Times
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