Notes on Wiping Contact Methods for Current and Potential Measurements

Author(s): Benj. F. Thomas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1892
Volume: IX
Page(s): 263 - 270
ISSN (Paper): 0096-3860
DOI: 10.1109/T-AIEE.1892.5570450
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